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Beilstein J. Nanotechnol. 2015, 6, 2278–2289, doi:10.3762/bjnano.6.234
Figure 1: First experimental observations of the nanoripple formation on polymer films (2 × 2 μm2): from a pr...
Figure 2: Topographical images in contact mode of three circular ripples created by a resistively heated AFM ...
Figure 3: Topographical images (1.5 × 1.5 μm2) of surfaces scratched in the multiple line mode. The PS films ...
Figure 4: Solvent-enriched polymer films. Examples of 3D ripple structures on PCL (left) and PET (right). The...
Figure 5: The worn area is the result of scanning a given surface with a variably heated tip, increasing T fr...
Figure 6: Topographical images (1.5 × 1.5 μm2) of patterns induced on films obtained from blending two PS sol...
Figure 7: Ripple periodicity (left column) and ripple amplitude (right column, continuous curves) as a functi...
Figure 8: (a) Topographical images (1 × 1 μm2) of nanoripples created by means of a resistively heated tip at...
Figure 9: Theoretical variation of the ripple periodicity (left column) and ripple amplitude (right column) a...
Figure 10: Topographical image of a series of scratches performed on 2 μm long lines on a PS film (Mw = 325 kD...
Figure 11: A topographical image of nanoripple patterns on a circular area. The color scale covers a range of ...
Figure 12: (A) The morphologies and cross-sections of the ripples. The corresponding scratching angles are 0° ...
Figure 13: Topography (A) and lateral force (retrace, B) maps and profiles corresponding to the black lines (C...